PRODUCT DETAILS

PAF 112 - Cabin Air Filter Test System - E DIN 71 460-2 (Gaseous Adsorption Test of Filters)

PAF 112 - Cabin Air Filter Test System - E DIN 71 460-2 (Gaseous Adsorption Test of Filters)

The Adsorption Test Stand PAF 112 for Air Filters for Passenger Compartments is used for quantification of adsorption capacity or desorption behaviour of filters. Since 1995 the Topas GmbH developes and manufactures both standardized and user-defined test benches for conducting tests and reasearch tasks to filter media and filter elements. The design of the Adsorption Test Stand PAF 112, the test procedure and data aquisition have been based on the E DIN 71460-2 and ISO 11155-2 standard .

The test section and associated ductwork are fabricated from stainless steel. Different sizes of filter media samples and elements can be tested and are mounted in a special adapter. A window in front of the test section allows visual observation of the sample during the test. A pair of mass flow controllers is used for metering gaseous components from gas cylinders and a new, sophisticated, dosing unit for liquid gas components has been developed specifically for this application. This is based on evaporation of a droplet spray atomized by means of a two-stream nozzle fed from a µl-dosing pump. The gas concentration can be measured downstream of the filter. An exhaust system by-passing the test channel facilitates maintaining a very stable gas dosing.

Test acc. to standards DIN 71460-1 and ISO/TS 11155-1 can be carried out using Topas Particle Filtration Test Rig PAF 111.

For filter tests both acc. to standards DIN 71460-1, ISO/TS 11155-1 and E DIN 71460-2, ISO 11155-2 Topas has designed filter test rig PAF 113 (to be seen on adjoining picture) combining all features of test rigs PAF 111 and PAF 112.

The Adsorption Test Stand PAF 112 for Air Filters for Passenger Compartments is used for quantification of adsorption capacity or desorption behaviour of filters. Since 1995 the Topas GmbH developes and manufactures both standardized and user-defined test benches for conducting tests and reasearch tasks to filter media and filter elements. The design of the Adsorption Test Stand PAF 112, the test procedure and data aquisition have been based on the E DIN 71460-2 and ISO 11155-2 standard .

The test section and associated ductwork are fabricated from stainless steel. Different sizes of filter media samples and elements can be tested and are mounted in a special adapter. A window in front of the test section allows visual observation of the sample during the test. A pair of mass flow controllers is used for metering gaseous components from gas cylinders and a new, sophisticated, dosing unit for liquid gas components has been developed specifically for this application. This is based on evaporation of a droplet spray atomized by means of a two-stream nozzle fed from a µl-dosing pump. The gas concentration can be measured downstream of the filter. An exhaust system by-passing the test channel facilitates maintaining a very stable gas dosing.

Test acc. to standards DIN 71460-1 and ISO/TS 11155-1 can be carried out using Topas Particle Filtration Test Rig PAF 111. For filter tests both acc. to standards DIN 71460-1, ISO/TS 11155-1 and E DIN 71460-2, ISO 11155-2 Topas has designed filter test rig PAF 113 (to be seen on adjoining picture) combining all features of test rigs PAF 111 and PAF

Advantages
  • Operator is guided through test routines
  • Modular system
  • Versatile
  • State of the art
Control Software PAFWin
  • Automatic test procedures in accordance with issued standards
  • Manual control for service, calibration procedures and research applications
  • Data monitor for long term investigations
  • Sample and test data base
  • Test dust and test gases data base
  • Data analysis and statistical calculations
  • Data copy & paste, Dynamic Data Exchange DDE 112.

PTek, located at Hyderabad, is engaged in offering best equipment and services to the industry and research institutes in the field of Air Filter Testing, Aerosol generation, Semiconductor Process Equipment & Cryogenic systems.